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XIS-6545DV™ Checkpoint Scanner

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XIS-6545DV™ Checkpoint Scanner

Description

Astrophysics’ XIS 6545DV™ is an advanced dual view X ray system. Twin generators deliver upward and diagonal perspectives, each independently adjustable, enabling fast yet thorough checks in multiple screening modes. High contrast, color rich imaging software lets operators pinpoint materials, recognize shapes, and isolate threats quickly and accurately, boosting security efficiency in confined spaces and high traffic facility deployments.

Key Features

  • High-resolution images with 24-bit color
  • Enhanced material discrimination
  • Repositioned generator for reduced footprint
  • Windows Operating System with Intel® Core™ Processor
  • Real-Time Diagnostics
  • High-contrast image analysis
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